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Physics in Canada / La Physique au Canada - 2011 (67.2)
Ramp-edge Josephson Junctions Based on Electron-doped Cuprates
Author(s)
Patrick Fournier
Sophie Charpentier
Guillaume Roberge
Sébastien Godin-Proulx
Institution
Université de Sherbrooke and Member, CIFAR
Université de Sherbrooke
Université de Sherbrooke
Université de Sherbrooke
We present a quick survey of the properties of Josephson junctions and a few strategies used to fabricate them with cuprate high temperature superconductors. As an example, we show our recent results on ramp-edge junctions where both superconducting electrodes and the barrier are based on electron-doped cuprates. These superconducting-normal-super-conducting junctions obtained in the ramp-edge geometry present current-voltage characteristics, field dependence of the critical current and Shapiro steps in ambient RF field confirming their quality. They can be used to study the proximity effect through electron-doped barriers with different doping levels.
